Product overview

The Microscope-Based Photoelectrical Analysis System uses photocurrent scanning technology to examine the specific conditions of materials such as solar cells and two-dimensional materials. It can measure fluorescence, Raman spectroscopy, and photocurrent data, and can be equipped with accessories such as femtosecond lasers and cryogenic systems. It can both photograph and scan materials, and perform fine processing on material surfaces. Whether identifying problems in solar cells or researching the usability of two-dimensional materials, it can provide accurate information, helping researchers and industry advance their work.

Advantages

Ultra-wide multi-wavelength excitation light source

Light information collected from reflecting microscopes

Support measurement modes of fluorescence, Raman, photocurrent, etc.

Support sample mobile scanning and galvanometer scanning and other solutions

Highly automated system

Parameters

Light source	Excitation light source	Standard single-mode polarization-maintaining fiber laser:405 nm, 520 nm, 1550 nm *Optional choices include pico second pulse lasers, quantum cascade lasers (QCL),LED light sources, continuously tunable super continuum lasers, laser-driven white light sources, and deuterium-halogen broad-spectrum light sources. The light source of the entire set of equipment and the associated optical components such as the associated filter can be completely controlled by computer software.
Light source	Lighting source	Equipped LED white light source with optional R/G/B monochromatic modes
Optical objective lens	Objective lens nasal wheel	A manual 5-hole revolver nosepiece, compatible with microscope objectives from companies like Zeiss, Nikon, and others.
Optical objective lens	Objective lens magnification	Visible light far-field correction objective lens:20 x,50 x Near-infrared flat-field apochromatic objective lens:10 x *Microscope objectives optionally available for other wavelengths.
Scanning platform	XY Motion module	The XY direction stroke is 150 mm each, the closed-loop accuracy is 50nm, the minimum moving step is 100 nm, and the repeat positioning accuracy is 0.25 um.
	Z-axis motion module	Z-axis load :>20.0 kg, stroke :> 15 mm, repeat positioning accuracy:± 1um
	Stage	Two axis tilt stage α axis :± 2°, β axis :± 2°and wire bonding module *Optional vacuum sample adsorption module
	Probe seat	Four probes with displacement accuracy of 5 um and coaxial probe diameter of5 um, connected with BNC coaxial cable. Breakdown voltage:500 V, leakage current: < 10 pA * Ultra-low leakage coaxial probe, RF probe and non-magnetic probe are optional, according to the application requirements.
Electrical transport test module	A sample tray	With four room temperature sample holders, with leakage current is less than 100 pA.
Electrical transport test module	Electrical transport expansion box	An electrical transport expansion box, featuring 15 BNC female ports, designed to extend and expand connections to densely packed test points for electrical signal detection.lt includes 1 ground connection interface to prevent electrostatic discharge damaging the samples.
Source meter	Four-quadrant precision voltage and current source meter	Maximum current source range 1 A Maximum voltage source range 200 V Measurement resolution (current/voltage) 10 fA/ 10 nV
Source meter	Lock-in amplifier	Differential or single-ended input mode Current or voltage signal input mode Gain setting range from 2 nv to lV (full range range) Frequency response range from 0.001 Hz to 102.4 kHz Automatic adjustment of gain, phase, dynamic reserve, compensation setting time constant range: 10 us to 30 ks Dynamic Reserve :> 100 dB Computerinterface :GPlB and RS-232
Optical table	Optical table	Vibration isolation platform

FAQ

What is this Multimodal Optoelectronic Microscope mainly used for?

Simply put, it's a "specialized tool" for analyzing materials and devices. It can be used to examine the properties and identify problems of materials like solar cells, two-dimensional materials, and luminescent materials. It can also perform fine processing on material surfaces, making it useful for both scientific research and industrial development.

What can it measure?

It can measure quite a lot. It can measure photocurrent, fluorescence, Raman spectroscopy, and also capture scanning images and measure fluorescence lifetime. For example, it can determine the location of defects in solar cells and the structure of two-dimensional materials.

Can I choose the configuration myself?

Yes. For the light source, it comes standard with 405nm and 520nm lasers. If that's not enough, you can add picosecond pulsed lasers and QCL light sources. Additionally, modules for low-temperature testing and accessories for femtosecond processing can be selected according to your needs.

How accurate are the results?

The accuracy is quite high. The XY-axis scanning closed-loop accuracy reaches 50nm, capable of clearly measuring submicron-level devices. It can also simultaneously acquire several signals, providing comprehensive data that is highly reliable for material property analysis.

Is it difficult to operate?

Not really. The system is highly automated; the light source and scanning functions can be controlled by computer software, eliminating the need for repeated manual adjustments. Furthermore, components such as the stage and probe holder are readily available and ready to use immediately.

Certifications

Our company's optical equipment (including optical processing equipment and optical inspection equipment) has successfully obtained ISO certification.