Your Professional Test Wafer Supplier
Nice-tech is a professional semiconductor equipment provider with a dedicated factory and an experienced technical team. Our operations are supported by multiple production lines equipped with standardized process control and key semiconductor-related equipment to ensure stable quality and delivery. The company is backed by a skilled team of engineers, technicians, and project specialists with solid industry experience, enabling effective coordination between equipment suppliers and end users.
why choose us
Tailored Solution Delivery
Our experienced team analyzes clients' specific needs to match the most suitable semiconductor equipment and offer customized solutions for different production and R&D scenarios.
Comprehensive Technical Support
We provide full-cycle technical assistance, from equipment commissioning to maintenance, including on-site troubleshooting and real-time online consultation, reducing operational hassles.
Support for Advanced Processes
We continuously invest in industry insights and adapt to cutting-edge tech trends, offering high-precision equipment solutions and upgrading services to meet high-end chip production needs.
Service Advantages
Offer 1v1 online support for equipment operation, parameter adjustment, and process optimization, responding to your questions promptly.

TC Wafer is used in semiconductor manufacturing processes to provide real-time process monitoring and environmental temperature control at each stage of the process, such as etching, photolithography, CVD, PVD, testing, front-end and back-end packaging, etc. We provide highly customized products, through sophisticated technology and complete customer support services, so we can meet the various needs of users.
|
TYPE |
TCW-6-5 |
TCS-8-5 |
TCSW-8-9 |
|
Temperature Range |
R.T.-1200℃ |
||
|
Wafer Size |
6 inch |
8 inch |
8 inch |
|
Test Points |
5 |
5 |
9 |
|
Wafer Material |
Silicon |
Silicon |
Silicon |
|
Temperature Test Precision |
± 1.1℃ /±0.4% |
± 1.1℃ /±0.4% |
± 1.1℃ /±0.4% |
Features of TC Wafer
Embedded Thermocouples:
TC wafers have thermocouples embedded at various points to provide accurate and real-time temperature measurements across the wafer surface.
High-Temperature Range:
These wafers can withstand and accurately measure a wide range of temperatures, which is critical for processes that involve high temperatures.
Uniformity Measurement:
TC wafers help in assessing temperature uniformity across the wafer, which is crucial for ensuring consistent process results and high-quality semiconductor devices.
Real-Time Monitoring:
They provide real-time temperature data, enabling process engineers to make immediate adjustments to maintain optimal conditions during manufacturing.
Calibration and Process Control:
TC wafers are used for calibrating temperature settings in semiconductor equipment, ensuring that the actual temperatures match the setpoints.
Compatibility with Process Equipment:
Designed to be compatible with standard semiconductor processing equipment, allowing for seamless integration into existing workflows.
Durability and Reusability:
Made to be durable and reusable, TC wafers can undergo multiple cycles of high-temperature processes without significant degradation.
Benefits of TC Wafer
Improved Process Control:
Enhanced ability to control and optimize semiconductor manufacturing processes by providing precise temperature data.
Higher Yield and Quality:
By maintaining optimal temperatures, TC wafers help achieve higher yields and better-quality semiconductor devices.
Reduced Downtime:
Early detection of temperature anomalies allows for quicker adjustments and reduces process downtime.
Process Development and Optimization:
Facilitates the development and fine-tuning of new processes by providing detailed temperature profiles.
Chemical Vapor Deposition (CVD):
Ensuring uniform temperature distribution during the deposition of thin films.
Etching:
Monitoring and controlling the temperature during plasma etching to achieve precise patterning.
Annealing:
Measuring temperatures during annealing processes to ensure proper activation of dopants and stress relief in the wafer.
Rapid Thermal Processing (RTP):
Providing accurate temperature profiles during rapid heating and cooling cycles.
Oxidation:
Controlling the temperature during oxidation processes to form high-quality oxide layers on the wafer surface.
Epitaxy:
Ensuring temperature consistency during the growth of epitaxial layers.
Physical Structure and Material Composition of TC Wafer
Substrate Material: Typically, the same material as the production wafer is used, such as silicon, sapphire, or silicon carbide, to ensure matching thermal expansion coefficients and avoid stress caused by temperature changes that could affect measurement accuracy. The choice of substrate material depends on the specific application scenario; for example, silicon substrates are suitable for most integrated circuit processes, while sapphire and silicon carbide are more suitable for high-temperature and special application environments.
Sensor Network: Distributed on the wafer surface in the form of a thermocouple array, commonly using K-type thermocouples (chromel-alumel alloy). The junction size is extremely small (wire diameter only 0.127-0.254mm), forming a uniformly distributed array centered around the wafer. These miniature thermocouples are fixed at specific positions on the wafer using high-precision welding processes. For large 300mm (12-inch) wafers, the sensor position accuracy needs to be controlled within ±50μm to ensure the accuracy of the temperature distribution map.
Signal Transmission System: Includes high-temperature resistant cables (usually wrapped in alumina ceramic fiber sleeves) and vacuum feedthroughs (polyimide flat cables), ensuring stable transmission of temperature signals in ultra-high vacuum environments of 10⁻⁷ Torr and extreme temperature conditions.
Features of TC Wafer
Real-time temperature monitoring:
Obtains real-time temperature measurements at key locations on the wafer surface, as well as the overall temperature distribution of the wafer.
Transient temperature analysis:
Continuously monitors the transient temperature changes of the wafer during the heat treatment process, such as heating, cooling, and dwell periods, providing critical data support for process optimization.

Operating Procedure Precautions
TC Wafer sensor are functioning correctly, and perform maintenance and calibration to ensure measurement accuracy.
Clean the wafer surface and check for damage or residual foreign matter; if a support or carrier is needed, ensure proper alignment.
Preheating Treatment: Preheat the wafer before testing to ensure uniform surface temperature.
Parameter Settings: Set annealing temperature, time, atmosphere, and other parameters according to the wafer material and processing requirements, and select the appropriate measurement mode.
Real-time Monitoring and Recording: Closely monitor the measurement results, avoiding shaking the sensor or wafer; record measurement time, location, and other information for subsequent analysis.
Wear protective gloves and safety glasses throughout the operation; turn off the equipment according to operating instructions after testing.
Clean and maintain the equipment to ensure long-term stable operation; wait for the wafer to cool before handling to avoid temperature shock affecting quality.
FAQ
As one of the most professional test wafer manufacturers and suppliers in China, we're featured by quality products and good price. Please rest assured to buy customized test wafer from our factory. For quotation and pricelist, contact us now.
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